With engineers rushing tests in order to hit tight product deadlines, the market for test equipment that automatically detects faults in semiconductors and other components is growing.

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In this project an NI CompactDAQ Chassis with four slots was utilized (NI cDAQ USB-9174). The slots were filled with the following modules:
NI-9205 – 32 channels of analog input.
NI-9264 – 16 channels of analog output
NI-9211 – 4 channels of thermocouples
NI-9203 – 8 channels of 4mA-20mA current values.
The analog input channels were used to read a variety of sensors such as temperature sensors (thermistors), pressure sensors, hall sensors (to read engine positions and velocities), as well as other sensors.
The analog output module operated the different devices, such as the stepper motor that was used as a scanner, a pump that was used to chill the system and a heater that was used to heat the system. The heater was operated by pulse width modulation (PWM) and worked in the PID mode, according to the thermistor (temperature) sensors.
Another engine was operated at different velocities, according to a linear operation profile. A hall sensor that measured the engine velocity was used to sample the real engine velocity and, according to the set-point velocity, was applied vie the analog output voltage. An additional analog output module was used as a binary button to enable/disable the configuration.
Ambient temperature values were acquired with a thermocouple module at different locations in the system. The current module was used to acquire signals from vibration sensor (for safety uses) and a calibrated pressure sensor in order to calibrate the internal pressure sensors.
ReadyDAQ customized the order to meet the customer’s requirements, and since the software application was not build from scratch the software was delivered very fast and in reasonable budget.
At ReadyDAQ we are ready to build and customize our software for any project that you are working on.
Some sample projects include:
With engineers rushing tests in order to hit tight product deadlines, the market for test equipment that automatically detects faults in semiconductors and other components is growing.
Automated test equipment (ATE) is computer-controlled test and measurement equipment that allows for testing with minimal human interaction. The tested devices are referred to as a device under test (DUT).
Have you ever viewed a LabVIEW VI Hierarchy and become frustrated with not being able to locate a VI you needed to open?
“ReadyDAQ provides a customizable LabVIEW solution which is both time saving and affordable”.
The team – ReadyDAQ has a dedicated team of physicists, electrical engineers, and programmers who work to provide a data acquisition solution for any project in different difficulty levels.